The Effect of HR EBSD Detectors on Orientation and Strain Measurement Accuracy
Prof. David Dingley presents the latest research around high resolution EBSD detectors (2k x 2k pixels and above) and the effect on orientation and strain measurement accuracy. What are the benefits on the path to absolute strain measurement? This work was first presented at RMS EBSD 2021. You can find the video on our YouTube Channel below.
